We just got our print of the JVST Special Topic Collection “Reproducibility Challenges and Solutions with a Focus on XPS”. The topics were discussed during the 66th AVS International Symposium and are now comprehensively presented in this soft-bound book.
The collection of well curated articles helps scientists and students to profit from the experiences of dedicated specialists in the field and to learn about the established standards from experiment planning over quantitative analysis to reporting. Accordingly, the collection covers a huge amount of practical relevant topics, which are addressed throughout the articles [1]:
- Planning and XPS information
- Sample preparation
- Instrument set up and calibration
- Spatial resolution
- Sample charging
- Sample damage
- Statistics /uncertainty / signal-to-noise
- Peak identification
- Peak fitting
- Spectral backgrounds
- Quantification
- Depth profiling / layer thickness information
- Path length /analysis depth
- Recording and reporting
This book will help to preserve the high standards in XPS analysis and other quantitative methods. We thank all contributors and organizers for this great work!
Full table of content:
https://avs.scitation.org/toc/jva/collection/10.1116/jva.2020.REPROD2020.issue-1
Reference:
[1] Donald R. Baer, Gary E. McGuire, et al., J. Vac. Sci.Technol. A 39, 021601 (2021), doi: 10.1116/6.0000873
