Scientific Instruments

NanoESCA MARIS

Next Generation Photoemission Tool for Real- and Momentum Microscopy.

PEEM

Photoemission Electron Microscope with various types of energy filter for real space- and momentum microscopy.

Ion Sources

Focused hot filament Ion sources for ultra clean sample preparation and XPS/Auger depth profiling.

EFM Evaporators

Electron beam evaporator in various configurations for ultra clean thin film and sub monolayer deposition under UHV conditions for surface science.

Spin Analysis

Electron polarisation detectors based on electron scattering at different single crystals/epitactic thin films.

Photon Sources

Vacuum Ultra Violet and Mercury light sources for photoelectron spectroscopy and photoemission electron microscopy.